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1

(

Xie, Jushan, Knorr, Klaus

Journal:

Physical Review B

Year:

1994

Language:

english

File:

PDF, 148 KB

english, 1994

2

mixed crystals

Xie, Jushan, Enderle, Mechthild, Knorr, Klaus, Jodl, H. J.

Journal:

Physical Review B

Year:

1997

Language:

english

File:

PDF, 131 KB

english, 1997

3

A cross-sectional study to investigate the correlation between depression comorbid with anxiety and serum lipid levels

Wang, Jinmin, Jiang, Changying, Chen, Liling, Wu, Songying, Lin, Jushan, Gao, Lili, Xie, Buni, Zheng, Dengzi, Yang, Ruiling, Li, Shiju, Pan, Xiaoming, Liao, Yuansheng

Journal:

Comprehensive Psychiatry

Year:

2016

Language:

english

File:

PDF, 281 KB

english, 2016

4

[IEEE 2015 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2015.12.7-2015.12.9)] 2015 IEEE International Electron Devices Meeting (IEDM) - Reliability variability simulation methodology for IC design: An EDA perspective

Zhang, Aixi, Huang, Chunyi, Guo, Tianlei, Chen, Alvin, Guo, Shaofeng, Wang, Runsheng, Huang, Ru, Xie, Jushan

Year:

2015

Language:

english

File:

PDF, 1.26 MB

english, 2015

5

[IEEE 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Irvine, CA (2017.11.13-2017.11.16)] 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Towards reliability-aware circuit design in nanoscale FinFET technology: — New-generation aging model and circuit reliability simulator

Guo, Shaofeng, Wang, Runsheng, Yu, Zhuoqing, Hao, Peng, Ren, Pengpeng, Wang, Yangyuan, Liao, Siyu, Huang, Chunyi, Guo, Tianlei, Chen, Alvin, Xie, Jushan, Huang, Ru

Year:

2017

Language:

english

File:

PDF, 860 KB

english, 2017

6

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Recent Updates to Transistor Level Reliability Analysis

Schaldenbrand, Art, Xie, Jushan, Elhak, Hany

Year:

2019

Language:

english

File:

PDF, 34 KB

english, 2019

7

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Recent Updates to Transistor Level Reliability Analysis

Schaldenbrand, Art, Xie, Jushan, Elhak, Hany

Year:

2019

File:

PDF, 34 KB

2019